ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...

Embedded test compression was commercially introduced over a decade ago and has scaled to well beyond the 100X range envisioned when it was first introduced. However, growing gate counts enabled by ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...