Many styles of test interfaces have been optimized for various constraints and goals over the years. There does, however appear to be a trend of test moving toward standard interfaces and increased ...

This paper discusses an approach to timing closure to eliminate non-determinism in an asynchronous interface while performing AC characterization on ATE (automatic test equipment). By closing the ...

Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...

Wanting to test the response curves on some analog parts, [Don Sauer] devised a way of using simple tools to graph analog tests on a computer. Here you can see the results of testing NPN, PNP, NMOS ...