With advanced technology nodes, the SoCs are growing in density and gate count. This creates challenges regarding the testability, and more importantly, the test cost. The design complexity and size ...
As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...
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