FA engineers are expected to produce accurate results. Thus, there is no room for error when it comes to the data provided by instruments. Due to its data precision ...

The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...

Asylum Research has announced Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy (AFM) technique that enables nanoscale mapping of permittivity and conductivity with ...

For a long time Fast Scanning in Scanning Probe Microscopy was limited by two factors: no commercial High Speed Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) were available and ...