Scanning probe microscopy (SPM) has emerged as an indispensable suite of tools for probing and manipulating chemical phenomena at solid interfaces with atomic precision. By bringing a sharp tip into ...

Dimensional metrology using scanning probe microscopy (SPM) refers to the precise measurement of three‐dimensional features at the micro‐ and nanoscale by raster-scanning a sharp probe across a ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

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Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its structure on the atomic scale. When using this technique, however, they can ...

A new electron spin resonance-atomic force microscopy setup enables single-spin quantum control on nonconductive samples.

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

Researchers from the School of Physics and Astronomy and the Czech Academy of Sciences have created what is believed to be ...