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Making Microscopy Simple with Automated Control
Hitachi High-Tech has recently introduced the SU3800SE and SU3900SE scanning electron microscopes (SEMs), which enhance the capabilities of the field-proven SU3800 and SU3900 models. Image Credit: ...
A physics-based autofocus method uses dual LED lighting to detect and correct defocus in microscopes. It enhances imaging ...
These new instruments are designed to meet specific application needs, offering two specimen chamber sizes and a choice between a thermal tungsten and Schottky field emitter. The advanced Field ...
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