Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...
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