ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...
While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...
Embedded test compression was commercially introduced over a decade ago and has scaled to well beyond the 100X range envisioned when it was first introduced. However, growing gate counts enabled by ...
Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
Modern embedded systems are expected to operate with predictable timing, continuous reliability, and near-instantaneous response under increasingly complex workloads. From automotive control units and ...
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