If your circuit design has requirements to be tolerant to certain faults and to report their occurrence, you’ll need to test the fault detection and protection features of your design during the test ...

S&C Electric Co., an employee-owned company with global headquarters in Chicago, Illinois, rolled out an innovative solution designed to mitigate nuisance outages for power customers located on the ...

Fault localisation, an essential component of modern software engineering, seeks to identify and isolate faulty portions of code, thereby expediting the debugging process and improving overall system ...

Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

HD Electric to feature UCT-8 at the IEEE PES T&D Expo HD Electric Co., a Textron Inc. company, now offers its new Underground Cable Fault Tester, the UCT-8, a lightweight one-piece tool that is used ...

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...