Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A physics-based autofocus method uses dual LED lighting to detect and correct defocus in microscopes. It enhances imaging ...

When using a measurement microscope, users can measure the size and dimensions of sample features in both two and three dimensions, which is important for inspection, quality control (QC), failure ...

Calibration is the process of adjusting and verifying that an instrument, for example, an optical microscope, is taking measurements accurately by comparing them to a known measurement standard or ...