CU Independent

Reducing Risk in Banking With Automated Testing

Discover how AI-driven automated testing in banking reduces risk, ensures compliance, and boosts customer trust with smarter ...
Semiconductor Engineering

Enhancing Silicon Reliability With In-System Test And SLM Data

A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Can Your ATPG Do This? Cut Defects Escaping Detection With ML

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...