For almost 20 years, researchers and semiconductormanufacturers have been trying to developa practical analog BIST (built-in self-test) formixed-signal ICs. By enabling mixed-signal ICtesting on ...
In-circuit test (ICT) has been instrumental in identifying manufacturing process defects and component defects on countless varieties of populated printed circuit board (PCB) assemblies for more than ...
Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
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