BENGALURU, India — ARM has set up a VLSI test lab at its design center here to analyze intellectual-property libraries and ARM physical IP, so as to correlate design to silicon behavior. Such activity ...
Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...
The IEEE's Test Technology Technical Council (TTTC) has extended the deadline for paper submissions for the 2003 IEEE VLSI Test Symposium, slated for April 27 to May 1 in Napa Valley, CA. Paper ...
Functional Verification validates whether a design behaves according to its specification by simulating the RTL using a variety of input stimuli. Formal Verification uses mathematical models to prove ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
The U.S. Court of Appeals for the Federal Circuit (CAFC) today issued a precedential decision authored by Chief Judge Moore ...
Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...
Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.
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