(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

Oleksandr Yefanov, Cornelius Gati, Gleb Bourenkov, Richard A. Kirian, Thomas A. White, John C. H. Spence, Henry N. Chapman, Anton Barty Philosophical Transactions ...

X-ray diffraction (XRD) is an analytical method that probes the periodic arrangement of atoms in crystalline materials by measuring the angular distribution and intensity of X-rays scattered by the ...

X-ray diffraction (XRD) is an essential technique to identify the structures and compositions of newly developed materials. However, XRD patterns consist of multiple peaks, and it is not always ...

X-ray crystallography is a powerful non-destructive technique for determining the molecular structure of a crystal. X-ray crystallography uses the principles of X-ray diffraction to analyze the sample ...

Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.

With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...

Small angle X-ray scattering, or SAXS, is an experimental method where the intensity of the scattered X-rays is measured as a function of the scattering angle. The information obtained in a SAXS ...

Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...