IEEE

Advanced Student Monitoring System for Physical Classes Using Pattern Recognition and Behavioral Analysis

Abstract: This research aims to develop an intelligent classroom system that utilizes Computer Vision and Deep Learning to measure students' concentration levels and performance, enabling teachers to ...
IEEE

A Noise Invariant Method for Bearing Fault Detection and Diagnosis Using Adapted Local Binary Pattern (ALBP) and Short-Time Fourier Transform (STFT)

Abstract: This study proposes a new method for bearing Fault Detection and Diagnosis (FDD) in Belt Starter Generators (BSGs) using vibration signals. The Adapted Local Binary Pattern (ALBP) method is ...
Semiconductor Engineering

AI Accelerators Usher In New Era For IC Test

The number and variety of test interfaces, coupled with increased packaging complexity, are adding a slew of new challenges.
YouTube on MSN

The AI stack explained: The five layers powering the biggest infrastructure build in history

The AI Stack Unpacked: Beyond the hype of chatbots lies a 5-layer infrastructure—from silicon to energy—reorganizing the ...