Abstract: This paper investigates the surge reliability of commercial 1200V SiC MOSFETs through a combined approach of experimental testing and multiphysics simulation, elucidating the failure ...
Abstract: Time-of-flight positron emission tomography (TOF-PET) detectors capable of advancing coincidence time resolution (CTR) beyond what is currently achieved in state-of-the-art commercial ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results